Invited Talk at the 2026 Korean Society of Microscopy Spring Conference
Dr. Young-Woon Byeon will give an invited talk on elucidating the surface degradation mechanisms of battery cathode composites using advanced electron microscopy and AI-based analysis.
Dr. Young-Woon Byeon will deliver an invited talk at the 64th Annual Spring Conference of the Korean Society of Microscopy (KSM), held on May 27–29, 2026 at the Daejeon Convention Center (DCC). The conference is organized by the Korean Society of Microscopy and sponsored by JEOL, with the JEOL Korea Users Meeting 2026 running on May 27 and the morning of May 28.
The talk — “Elucidating Surface Degradation Mechanisms of Battery Cathode Composites Using Advanced Electron Microscopy and AI-Based Analysis” — is scheduled for May 28 (Thu), 15:50–16:20 in the Energy Materials Symposium.
For more information, see the Korean Society of Microscopy homepage.